Federal grant · cooperative agreement (b)
Purpose:during Phase I, Nanoelectronic Imaging, Inc., Will Propose a Solution for Nanoscale Temperature Mapping in Operating Semiconductor Devices. the Proposed Solution Seeks to Provide a Straightforward Method for Transmission Electron Microscopy (TEM) Based Nanothermometry in Operating Devices, a Capability Currently Not Commercially Available.activities to Be Performed: 1. Image Heating Tasks - 1.5 MONTHS2. Process DEVELOPMENT3. Image Heating Tasks - 2.5 Monthsexpected Outcomes:nanoelectronic Imaging, Inc. Aims to Fill the Gap for Offering Practical Techniques With the Requisite Spatial Resolution and Temperature Sensitivity for Observing Nanoscale Defect Formation in Devices Operating at High Temperatures.intended Beneficiaries Include: the Initial Target Market Will Be Academic and Industry Researchers Developing Wide Bandgap Semiconductor Components.subrecipient Activities: the Recipient Does Not Intend to Subaward Funds.
Committed
$100,000
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