Amag Consulting, LLC

Purpose: Amag Consulting, LLC Project Will Be to Increase the Applicability of Simusem to More Customer's Use Cases by Addition/integration of Meshing, Charging and Rough Surface Generation Features. This Will Improve Process Control, Hybrid Metrology Comparisons Involving Sem, Sem Imaging Condition Optimization, Limits/feasibility Studies, Faux Image Generation for Ai Training, Calibration of Analytical Models, and Fundamental Understanding of Signal Generation, All Critical for Successful Metrology of Future Shrinking Devices.activities to Be Performed: During Phase I, a Charging Model Will Be Implemented in Simusem With an Inclusion of Charging Model and Rough Surface Capabilities Necessary for Accurate Simulation of Pertinent Dielectric Materials Which Charge Under Sem.expected Outcomes: Technology Development Under This Phase I Will Result in Improving Process Control, Hybrid Metrology Comparisons Involving Sem, Sem Imaging Condition Optimization, Limits/feasibility Studies, Faux Image Generation for Ai Training, Calibration of Analytical Models, and Fundamental Understanding of Signal Generation, All Critical for Successful Metrology of Future Shrinking Devices.intended Beneficiaries: the Awardee's Intended Beneficiaries Are the Semiconductor Industry. They Will Be Able to Refine Sem Metrology of Smaller, More Energy-efficient Chips for Commercial Electronics. Accurate/precise Sem Metrology Is Crucial for Correctly Understanding and Tightening Produced Feature Size Distributions for Process Control or Defectivity for the Billions of On-chip Transistors.subrecipient Activities: a Consultant Will Be Used in Phase I That Has Expertise in Improving Speed by Multi-threading and Distributed Processing and Also Developing Software Installation Systems.